Abstract
A theoretical approach is developed to invert analytically a hard X-ray analyser-based phase-contrast image of a known weak object to recover the complex amplitude reflection coefficient (ARC) of a laterally homogeneous crystal. Numerical simulations test the method to recover the ARC from two systems of interest: a thick perfect crystal and a linearly strained thin film. For the latter model, a kinematical diffraction approximation was used to recover the one-dimensional deformation profile from the ARC.
| Original language | English |
|---|---|
| Pages (from-to) | 650-657 |
| Journal | Journal of Applied Crystallography |
| Volume | 40 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2007 |
Keywords
- Surfaces and Structural Properties of Condensed Matter
- Photonics, Optoelectronics and Optical Communications
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