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Unambiguous reconstruction of the complex amplitude reflection coefficient of a laterally homogeneous crystal using analyser-based phase-contrast imaging

  • David Vine
  • , David Paganin
  • , Konstantin M Pavlov
  • , S G Podorov

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

A theoretical approach is developed to invert analytically a hard X-ray analyser-based phase-contrast image of a known weak object to recover the complex amplitude reflection coefficient (ARC) of a laterally homogeneous crystal. Numerical simulations test the method to recover the ARC from two systems of interest: a thick perfect crystal and a linearly strained thin film. For the latter model, a kinematical diffraction approximation was used to recover the one-dimensional deformation profile from the ARC.
Original languageEnglish
Pages (from-to)650-657
JournalJournal of Applied Crystallography
Volume40
Issue number4
DOIs
Publication statusPublished - 2007

Keywords

  • Surfaces and Structural Properties of Condensed Matter
  • Photonics, Optoelectronics and Optical Communications

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