Objective analysis of marker bias in higher education

Subrata Chakraborty; Xujuan Zhou; Abdul Hafeez-Baig; Raj Gururajan; Manoranjan Paul; Anuradha Mandal; Anila Elizabeth Chacko; Prabal D Barua

doi:10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education

Subrata Chakraborty
, Xujuan Zhou
, Abdul Hafeez-Baig
, Raj Gururajan
, Manoranjan Paul
, Anuradha Mandal
, Anila Elizabeth Chacko
, Prabal D Barua

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

Original language	English
Title of host publication	2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE)
Place of Publication	Los Alamitos, United States of America
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	453-457
ISBN (Print)	9781509055982, 9781509055999
DOIs	https://doi.org/10.1109/TALE.2016.7851839
Publication status	Published - 10 Feb 2017
Event	TALE 2016: International Conference on Teaching, Assessment, and Learning for Engineering - Bangkok, Thailand Duration: 7 Dec 2017 → 9 Dec 2017

Conference

Conference	TALE 2016: International Conference on Teaching, Assessment, and Learning for Engineering
City	Bangkok, Thailand
Period	7/12/17 → 9/12/17

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10.1109/TALE.2016.7851839

https://hdl.handle.net/1959.11/53025

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Chakraborty, S., Zhou, X., Hafeez-Baig, A., Gururajan, R., Paul, M., Mandal, A., Chacko, A. E., & Barua, P. D. (2017). Objective analysis of marker bias in higher education. In 2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE) (pp. 453-457). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/TALE.2016.7851839

@inproceedings{1a402aec72ab4a78a534ffa3af51cb77,

title = "Objective analysis of marker bias in higher education",

abstract = "Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.",

author = "Subrata Chakraborty and Xujuan Zhou and Abdul Hafeez-Baig and Raj Gururajan and Manoranjan Paul and Anuradha Mandal and Chacko, \{Anila Elizabeth\} and Barua, \{Prabal D\}",

year = "2017",

month = feb,

day = "10",

doi = "10.1109/TALE.2016.7851839",

language = "English",

isbn = "9781509055982",

pages = "453--457",

booktitle = "2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

note = "TALE 2016: International Conference on Teaching, Assessment, and Learning for Engineering ; Conference date: 07-12-2017 Through 09-12-2017",

}

Chakraborty, S, Zhou, X, Hafeez-Baig, A, Gururajan, R, Paul, M, Mandal, A, Chacko, AE & Barua, PD 2017, Objective analysis of marker bias in higher education. in 2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE). Institute of Electrical and Electronics Engineers (IEEE), Los Alamitos, United States of America, pp. 453-457, TALE 2016: International Conference on Teaching, Assessment, and Learning for Engineering, Bangkok, Thailand, 7/12/17. https://doi.org/10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education. / Chakraborty, Subrata; Zhou, Xujuan; Hafeez-Baig, Abdul et al.
2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE). Los Alamitos, United States of America: Institute of Electrical and Electronics Engineers (IEEE), 2017. p. 453-457.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Objective analysis of marker bias in higher education

AU - Chakraborty, Subrata

AU - Zhou, Xujuan

AU - Hafeez-Baig, Abdul

AU - Gururajan, Raj

AU - Paul, Manoranjan

AU - Mandal, Anuradha

AU - Chacko, Anila Elizabeth

AU - Barua, Prabal D

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N2 - Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

AB - Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

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DO - 10.1109/TALE.2016.7851839

M3 - Conference contribution

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SN - 9781509055999

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EP - 457

BT - 2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE)

PB - Institute of Electrical and Electronics Engineers (IEEE)

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T2 - TALE 2016: International Conference on Teaching, Assessment, and Learning for Engineering

Y2 - 7 December 2017 through 9 December 2017

ER -

Chakraborty S, Zhou X, Hafeez-Baig A, Gururajan R, Paul M, Mandal A et al. Objective analysis of marker bias in higher education. In 2016 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE). Los Alamitos, United States of America: Institute of Electrical and Electronics Engineers (IEEE). 2017. p. 453-457 doi: 10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education

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