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Learning out-of sample mapping in non-vectorial data reduction using constrained twin kernel embedding

  • Yi Guo
  • , Junbin Gao
  • , Paul Hing Kwan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Twin kernel embedding (TKE) is a powerful non-vectorial data reduction algorithm proposed for advanced applications in clustering and visualization, manifold learning, etc. Due to the requirement of online processing in many cutting edge research problems involving highly structured data like DNA, protein sequences and biometric features that are non-vectorial in nature, learning the out-of-sample (OOS) mapping becomes a necessity. To address this, we propose constrained TKE, which is an OOS extension of TKE capable of learning such a mapping function. This is achieved by including the mapping in the objective function optimized by the TKE algorithm. More broadly, this mapping function can be applied in other data reduction methods as an OOS extension. Furthermore, to improve the accuracy of predictions in case where new samples are presented in batch, a refinement strategy is introduced by exploiting the similarity between new samples which is often ignored by other methods. Experimental results on the Reuters-21578 text collection confirmed the usefulness of the proposed method.
Original languageEnglish
Title of host publicationProceedings of the 2007 International Conference on Machine Learning and Cybernetics
EditorsIEEE: Institute of Electrical, Electronics Engineers
Place of PublicationLos Alamitos, United States of America
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages19-24
ISBN (Print)9781424409730
DOIs
Publication statusPublished - 2007
EventICMLC 2007: 2007 International Conference on Machine Learning and Cybernetics - Hong Kong
Duration: 19 Aug 200722 Aug 2007

Conference

ConferenceICMLC 2007: 2007 International Conference on Machine Learning and Cybernetics
CityHong Kong
Period19/08/0722/08/07

Keywords

  • Pattern Recognition and Data Mining

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