Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development

H K Jnanamurthy; Frans Henskens; David Paul; Mark Wallis

doi:10.1109/I2CT.2018.8529446

Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development

H K Jnanamurthy
, Frans Henskens
, David Paul
, Mark Wallis

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 3rd International Conference for Convergence in Technology (I2CT)
Place of Publication	Piscataway, United States of America
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1-8
ISBN (Print)	9781538642733, 9781538642740
DOIs	https://doi.org/10.1109/I2CT.2018.8529446
Publication status	Published - 2018
Event	I2CT 2018: 3rd International Conference for Convergence in Technology - Gateway Hotel, Pune, India Duration: 6 Apr 2018 → 8 Apr 2018

Conference

Conference	I2CT 2018: 3rd International Conference for Convergence in Technology
City	Pune, India
Period	6/04/18 → 8/04/18

Access to Document

10.1109/I2CT.2018.8529446

https://hdl.handle.net/1959.11/29368

Handle.net

Persistent link

Cite this

Jnanamurthy, H. K., Henskens, F., Paul, D., & Wallis, M. (2018). Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development. In Proceedings of the 3rd International Conference for Convergence in Technology (I2CT) (pp. 1-8). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/I2CT.2018.8529446

@inproceedings{ce90efe3901b4ec08b774f03033ee98f,

title = "Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development",

author = "Jnanamurthy, \{H K\} and Frans Henskens and David Paul and Mark Wallis",

year = "2018",

doi = "10.1109/I2CT.2018.8529446",

language = "English",

isbn = "9781538642733",

pages = "1--8",

booktitle = "Proceedings of the 3rd International Conference for Convergence in Technology (I2CT)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

note = "I2CT 2018: 3rd International Conference for Convergence in Technology ; Conference date: 06-04-2018 Through 08-04-2018",

}

Jnanamurthy, HK, Henskens, F, Paul, D & Wallis, M 2018, Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development. in Proceedings of the 3rd International Conference for Convergence in Technology (I2CT). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, United States of America, pp. 1-8, I2CT 2018: 3rd International Conference for Convergence in Technology, Pune, India, 6/04/18. https://doi.org/10.1109/I2CT.2018.8529446

Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development. / Jnanamurthy, H K; Henskens, Frans; Paul, David et al.
Proceedings of the 3rd International Conference for Convergence in Technology (I2CT). Piscataway, United States of America: Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 1-8.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development

AU - Jnanamurthy, H K

AU - Henskens, Frans

AU - Paul, David

AU - Wallis, Mark

PY - 2018

Y1 - 2018

UR - https://ieeexplore.ieee.org/document/8529341

UR - https://ieeexplore.ieee.org/document/8529446

U2 - 10.1109/I2CT.2018.8529446

DO - 10.1109/I2CT.2018.8529446

M3 - Conference contribution

SN - 9781538642733

SN - 9781538642740

SP - 1

EP - 8

BT - Proceedings of the 3rd International Conference for Convergence in Technology (I2CT)

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, United States of America

T2 - I2CT 2018: 3rd International Conference for Convergence in Technology

Y2 - 6 April 2018 through 8 April 2018

ER -

Jnanamurthy HK, Henskens F, Paul D, Wallis M. Clone Detection in Model-Based Development Using Formal Methods to Enhance Performance in Software Development. In Proceedings of the 3rd International Conference for Convergence in Technology (I2CT). Piscataway, United States of America: Institute of Electrical and Electronics Engineers (IEEE). 2018. p. 1-8 doi: 10.1109/I2CT.2018.8529446