Abstract
The classical dynamical theory of X-ray diffraction is expanded to the special case of transversely restricted wavefronts of the incident and reflected waves. This approach allows one to simulate the two-dimensional coherently scattered intensity distribution centred around a particular reciprocal lattice vector in the so-called triple-crystal diffraction scheme. The effect of the diffractometer's instrumental function on X-ray diffraction data was studied.
| Original language | English |
|---|---|
| Pages (from-to) | 1256-1266 |
| Journal | Journal of Applied Crystallography |
| Volume | 50 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2017 |
Keywords
- Condensed Matter Physics
- Condensed Matter Characterisation Technique Development
- Condensed Matter Imaging
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