Abstract
We have performed an analyzer crystal based phase contrast imaging (ABI) experiment using a rotating anode x-ray source. The use of such an incoherent source demonstrates the potential of ABI as a quantitative characterization tool for the laboratory environment. A phase contrast image of a plastic phantom was recorded on high resolution x-ray film and the projected thickness was retrieved from a single image. The projected thickness recovered from the phase contrast image was shown to quantitatively agree with a reference optical microscope measurement.
| Original language | English |
|---|---|
| Article number | 254110 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 25 |
| DOIs | |
| Publication status | Published - 2007 |
Keywords
- Optical Physics
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